Defect and Microstructure Analysis by Diffraction looks at a key aspect of state-of-the-art methods for analyzing the actual structure of materials. Diffraction analysis is typically based on idealized crystals. The impurities and irregularities that work themselves into virtually all crystal
structures, however, cause diffraction peak profiles to broaden and sometimes become asymmetric, making the data difficult to interpret. More powerful methods are undoing this effect, using the discrepancies themselves to describe microstructure of the material with unprecedented accuracy. These
techniques in turn play a key role in many of the evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallite size, macro-strain and preferred orientation analysis. This book provides a comprehensive analysis of the fundamental theory and techniques
for microstructure analysis from diffraction patterns and summarizes the current state of the art. It lays the foundation for the next and last major development in this field: the extraction of the full information in a powder pattern by the simulation of the full experimental pattern. The goal of
this research is to extract all of the information locked in the powder diffraction pattern including the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation, along with the size and strain distributions of each phase in a
specimen.

• Introduction to Defect and Microstructure Analysis or the Analysis of Real-Structure


• Some Applications of the Kinematical Theory of X-ray Diffraction


• Profile Fitting and Analytical Functions


• Effects of Instrument Function, Crystallite Size, and Strain on Reflection Profiles


• Use of Pattern Decomposition or Simulation to Study Microstructure: theoretical considerations


• Classical Treatment of Line Profiles Influenced by Strain, Small Size, and Stacking Faults


• Voigt-Function Model in Diffraction Line-Broadening Analysis


• X-Ray Analysis of Precipitation Related Crystals with Dislocation Substructure


• The Dislocation Based Model of Strain Broadening in X-Ray Line-Profile Analysis


• Diffraction-Line Broadening Analysis of Dislocation Configurations


• Diffraction-Line Broadening Analysis of Strain Fields in Crystalline Solids


• Paracrystallinity


• The Model of the Paracrystal and its Application to Polymers


• Effect of Planar Defects in Crystal on the Position and Profile of Powder Diffraction Line


• Effect of Stacking Disorder on the Profile of the Powder Diffraction Line


• Crystallite Statistics and Accuracy in Powder Diffraction Intensity Measurements


• Reciprocal Space Mapping and Ultra-High Resolution Diffraction of Polycrystalline Materials


• X-Ray Analysis of The Inhomogeneous Stress State


• Texture Analysis


• Texture Effects in Powder Diffraction and their Correction by Simple Empirical Functions


• Accounting For Size and Microstrain in Whole Powder Pattern Fitting


• Modelling of Texture in Whole Pattern Fitting


• A New Whole Powder Pattern Fitting Approach


• The Role of Whole-Pattern Databases in Materials Science


• Restoration and Preprocessing of Physical Profiles from Measured Data


• Towards Higher Resolution: A Mathematical Approach


• Use of Pattern Decomposition to Study Microstructure: Practical Aspects and Applications


• X-Ray Diffraction Broadening Effects in Materials Characterization


• Crystal Size and Distortion Parameters in Fibres using WAXS


• Pressure Induced Profile Change of Energy Dispersive Diffraction