Bültmann & Gerriets
Electronic Design Automation
Synthesis, Verification, and Test
von Laung-Terng Wang, Yao-Wen Chang, Kwang-Ting (Tim) Cheng
Verlag: Elsevier Science & Techn.
E-Book / EPUB
Kopierschutz: Adobe DRM

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ISBN: 978-0-08-092200-3
Erschienen am 11.03.2009
Sprache: Englisch
Umfang: 972 Seiten

Preis: 73,95 €

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Klappentext
Inhaltsverzeichnis

This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI practitioners and researchers in need of fluency in an "adjacent" field will find this an invaluable reference to the basic EDA concepts, principles, data structures, algorithms, and architectures for the design, verification, and test of VLSI circuits. Anyone who needs to learn the concepts, principles, data structures, algorithms, and architectures of the EDA flow will benefit from this book.

  • Covers complete spectrum of the EDA flow, from ESL design modeling to logic/test synthesis, verification, physical design, and test - helps EDA newcomers to get "up-and-running" quickly
  • Includes comprehensive coverage of EDA concepts, principles, data structures, algorithms, and architectures - helps all readers improve their VLSI design competence
  • Contains latest advancements not yet available in other books, including Test compression, ESL design modeling, large-scale floorplanning, placement, routing, synthesis of clock and power/ground networks - helps readers to design/develop testable chips or products
  • Includes industry best-practices wherever appropriate in most chapters - helps readers avoid costly mistakes



Chapter 1: Introduction Chapter 2: Fundamentals of CMOS Design Chapter 3: Design for Testability Chapter 4: Fundamentals of Algorithms Chapter 5: Electronic System-Level Design and High-Level Synthesis Chapter 6: Logic Synthesis in a Nutshell Chapter 7: Test Synthesis Chapter 8: Logic and Circuit Simulation Chapter 9: Functional Verification Chapter 10: Floorplanning Chapter 11: Placement Chapter 12: Global and Detailed Routing Chapter 13: Synthesis of Clock and Power/Ground Networks Chapter 14: Fault Simulation and Test Generation.


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