Introduction. Basic test issues. Introduction. A review of analogue fault diagnosis.- Fault Diagnosis of Analogue Circuits using Model-based Observer Scheme. Introduction. The diagnosis procedure. The test stimulus generation. The fault modelling. Approximation modelling of the analogue integrated circuits. Artificial neural networks: an overview. Summary and conclusions.- Fault Diagnosis in Stand-alone Analogue Integrated Circuits. Introduction. The testing methodology. Simulation results. Discussion on the results obtained.- Fault Diagnosis in Embedded Analogue Integrated Circuits. Introduction. The testing methodology. Simulation results. Discussion on the results obtained.- Experimental Verification of the Fault Diagnosis Methodology. Introduction. The hardware realisation. Experimental results. Discussion on the results obtained.- Conclusions. Results and discussions.- Appendix. A.Typical BJT SPICE parameter values of the µA741 Op-Amp. B.Typical MOSFET SPICE parameter values of the MOS Op-Amp.- Bibliography.

Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.

Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits.

Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces .

Also contains problems that can be used as quiz or homework.