This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book reports systematically the state of the arts and future research directions of those areas.

• Chapter 1: Fault diagnosis of linear and non-linear analogue circuits


• Chapter 2: Symbolic function approaches for analogue fault diagnosis


• Chapter 3: Neural-network-based approaches for analogue circuit fault diagnosis


• Chapter 4: Hierarchical/decomposition techniques for large-scale analogue diagnosis


• Chapter 5: DFT and BIST techniques for analogue and mixed-signal test


• Chapter 6: Design-for-testability of analogue filters


• Chapter 7: Test of A/D converters: From converter characteristics to built-in self-test proposals


• Chapter 8: Test of Sigma Delta converters


• Chapter 9: Phase-locked loop test methodologies: Current characterization and production test practices


• Chapter 10: On-chip testing techniques for RF wireless transceiver systems and components


• Chapter 11: Tuning and calibration of analogue, mixed-signal and RF circuits