The world's leading expert on Lean Six Sigma provides the missing link for reducing waste and taking operations to the next level: Artificial Intelligence

Lean Six Sigma (LSS) has been helping companies improve their processes since 2001-but as yet, no one has taken this revolutionary management approach to its limits. Now, The Fourth Revolution in Manufacturing shows exactly how to do that-by adding artificial intelligence (AI) to the mix.

This game-changing guide takes you through the process of using AI to unlock maximum speed, solve complex manufacturing challenges, reduce waste, increase company profits, and ultimately beat the competition. Breakthrough Manufacturing explains how to:

* Unlock your company's full potential with the AI + LSS approach

* Utilize the AI + LSS three-step process to dramatically improve profits

* Apply AI + LSS to engineering and other non-manufacturing processes

* Harness the interaction of AI+LSS and the ERP system

* Create a scorecard and measure your results

McGraw-Hill authors represent the leading experts in their fields and are dedicated to improving the lives, careers, and interests of readers worldwide

Table of Contents

Author's Note

The Brain: Inspiration for the Neural Network and Deep Learning

Chapter 1: AI Data Mining Guides an EBITDA Turnaround

Chapter 2: The Waste That Only Artificial Intelligence Can Eliminate

Chapter 3: The Productivity Challenge of the Twenty-First Century

Chapter 4: Why Is the Fourth Industrial Revolution Needed Now?

Chapter 5: AI Data Mining, Product Flow, and Cycle Time

Chapter 6: Executive Overview of the Fourth Manufacturing Revolution

Chapter 7: Introduction to Deep Learning in Manufacturing

Chapter 8: Specific Applications of Deep Learning in Manufacturing

Chapter 9: AI Pull System Development

Chapter 10: Conducting an AI Readiness Assessment

Chapter 11: AI Lean Six Sigma in Process Industries

Chapter 12: AI in Predictive Maintenance to Prevent Machine Downtime

Chapter 13: AI in Project Management and Product Development

Endnotes

Index