1 Oscillation-Based Test Methodology. 1.1. Linking Oscillation with Testing: OBT Methodology. 1.2. The OBT oscillator. 1.3. The OBT concept revisited: proposal for robust OBT. 1.4. Conclusions: summarizing the new OBT concept. 2 Mathematical Review of Non-linear Oscillators. 2.1. Framework. 2.2. The Describing Function Method. 2.3. Applying the DF approach. 2.4. Error bound calculation for the DF approach. 2.5. Summary. 3 OBT Methodology for Discrete-Time Filters. 3.1. Feasible OBT strategy in discrete-time filters. 3.2. Application to a particular biquad structure. 3.3. Towards a general OBT biquad structure: Generic Oscillator. 3.4. Summary. 4 OBT Methodology for Modulators. 4.1. OBT Concept in Low-pass discrete-time SD modulators. 4.2. OBT Concept in Bandpass discrete-time SD modulators. 4.3. Practical OBT scheme for any type of modulators. 4.4. Summary. 5 OBT Implementation in Discrete-Time Filters. 5.1. A specific circuit. 5.2. Some practical examples. 5.3. Fault coverage considerations. 5.4. Oscillator Modelling Accuracy. 5.5. DTMF Biquad Validation. 5.6. Summary. 6 Practical considerations for OBT-OBIST application. 6.1. Applying the OBT-OBIST Methodology to the DTMF Macrocell. 6.2. On-chip evaluation of OBT output signals. 6.3. Electrical Simulation Results in the BIST Mode. 6.4. Digital Processing Part of the DTMF. 6.5. DTMF/OBIST operation modes description. 6.6. Summary. 7 OBT/OBIST silicon validation. 7.1. Introduction. 7.2. First Experimental Circuit Demonstrator. 7.3. Second Circuit Demonstrator: DTMF receiver. 7.4. Summary. Appendices. Conclusions. References.

This book presents the development and experimental validation of the structural test strategy called Oscillation-Based Test - OBT in short. The results presented here assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.

Prof. José Luis Huertas is Director of the Instituto de Microelectronica de Sevilla in Spain. He has edited one book on Testing for Kluwer, that published in October 2004, and was series editor for the three book series from the European Mixed-Signal Initiative for Electronic System Design.