Bültmann & Gerriets
X-Ray Multiple-Wave Diffraction
Theory and Application
von Shih-Lin Chang
Verlag: Springer Berlin Heidelberg
Reihe: Springer Series in Solid-State Sciences Nr. 143
Gebundene Ausgabe
ISBN: 978-3-540-21196-9
Auflage: 2004
Erschienen am 24.06.2004
Sprache: Englisch
Format: 241 mm [H] x 160 mm [B] x 29 mm [T]
Gewicht: 834 Gramm
Umfang: 448 Seiten

Preis: 160,49 €
keine Versandkosten (Inland)


Dieser Titel wird erst bei Bestellung gedruckt. Eintreffen bei uns daher ca. am 10. Oktober.

Der Versand innerhalb der Stadt erfolgt in Regel am gleichen Tag.
Der Versand nach außerhalb dauert mit Post/DHL meistens 1-2 Tage.

klimaneutral
Der Verlag produziert nach eigener Angabe noch nicht klimaneutral bzw. kompensiert die CO2-Emissionen aus der Produktion nicht. Daher übernehmen wir diese Kompensation durch finanzielle Förderung entsprechender Projekte. Mehr Details finden Sie in unserer Klimabilanz.
Klappentext
Inhaltsverzeichnis

X-ray multiple-wave diffraction, sometimes called multiple diffraction or N-beam diffraction, results from the scattering of X-rays from periodic two­ or higher-dimensional structures, like 2-d and 3-d crystals and even quasi­ crystals. The interaction of the X-rays with the periodic arrangement of atoms usually provides structural information about the scatterer. Unlike the usual Bragg reflection, the so-called two-wave diffraction, the multiply diffracted intensities are sensitive to the phases of the structure factors in­ volved. This gives X-ray multiple-wave diffraction the chance to solve the X-ray phase problem. On the other hand, the condition for generating an X­ ray multiple-wave diffraction is much more strict than in two-wave cases. This makes X-ray multiple-wave diffraction a useful technique for precise measure­ ments of crystal lattice constants and the wavelength of radiation sources. Recent progress in the application of this particular diffraction technique to surfaces, thin films, and less ordered systems has demonstrated the diver­ sity and practicability of the technique for structural research in condensed matter physics, materials sciences, crystallography, and X-ray optics. The first book on this subject, Multiple Diffraction of X-Rays in Crystals, was published in 1984, and intended to give a contemporary review on the fundamental and application aspects of this diffraction.



1. Introduction.- 2. Elements of X-Ray Physics and Crystallography.- 3. Diffraction Geometry.- 4. Experimental Techniques.- 5. Kinematical Theory of X-Ray Diffraction.- 6. Dynamical Theory of X-Ray Diffraction.- 7. Theoretical Approaches.- 8. Dynamical Diffraction Properties and Behaviors.- 9. Applications.- References.- Figure Acknowledgements.


andere Formate
weitere Titel der Reihe