Bültmann & Gerriets
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Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
139,09 €
in ca. 14 Tage
Buch
Formal Equivalence Checking and Design Debugging
192,59 €
in ca. 14 Tage
Buch
Research Perspectives and Case Studies in System Test and Diagnosis
160,49 €
in ca. 14 Tage
Buch
Design for AT-Speed Test, Diagnosis and Measurement
160,49 €
in ca. 14 Tage
Buch
Boundary-Scan Interconnect Diagnosis
160,49 €
in ca. 14 Tage
Buch
On-Line Testing for VLSI
106,99 €
in ca. 14 Tage
Buch
Delay Fault Testing for VLSI Circuits
160,49 €
in ca. 14 Tage
Buch
Testability Concepts for Digital ICs
160,49 €
in ca. 14 Tage
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Efficient Branch and Bound Search with Application to Computer-Aided Design
106,99 €
in ca. 14 Tage
Buch
From Contamination to Defects, Faults and Yield Loss
106,99 €
in ca. 14 Tage
Buch
Multi-Chip Module Test Strategies
106,99 €
in ca. 14 Tage
Buch
Introduction to IDDQ Testing
106,99 €
in ca. 14 Tage
Buch
Analog and Mixed-Signal Boundary-Scan
176,50 €
zum 10. November
Buch
Autor
Reasoning in Boolean Networks
176,50 €
zum 10. November
Buch