Bültmann & Gerriets
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Analog and Mixed-Signal Boundary-Scan
160,49 €
in ca. 14 Tage
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Fault Diagnosis of Analog Integrated Circuits
106,99 €
in ca. 14 Tage
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Fault-Tolerance Techniques for SRAM-Based FPGAs
106,99 €
in ca. 14 Tage
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Digital Timing Measurements
160,49 €
in ca. 14 Tage
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
213,99 €
in ca. 14 Tage
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Emerging Nanotechnologies
160,49 €
in ca. 14 Tage
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Boundary-Scan Interconnect Diagnosis
160,49 €
in ca. 14 Tage
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On-Line Testing for VLSI
106,99 €
in ca. 14 Tage
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Reasoning in Boolean Networks
160,49 €
in ca. 14 Tage
Buch
Embedded Processor-Based Self-Test
160,49 €
in ca. 14 Tage
Buch
Introduction to Advanced System-on-Chip Test Design and Optimization
160,49 €
in ca. 14 Tage
Buch
Autor
SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
106,99 €
in ca. 14 Tage
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Power-Constrained Testing of VLSI Circuits
106,99 €
in ca. 14 Tage
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Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation
160,49 €
in ca. 14 Tage
Buch
Verification by Error Modeling
106,99 €
in ca. 14 Tage
Buch
Testing Static Random Access Memories
106,99 €
in ca. 14 Tage
Buch
Soft Errors in Modern Electronic Systems
149,79 €
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Soft Errors in Modern Electronic Systems
173,50 €
zum 10. November
Buch
Data Mining and Diagnosing IC Fails
113,50 €
zum 10. November
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