Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices.

T. Mitch Wallis is a physicist in the Applied Physics Division at the National Institute of Standards and Technology, Boulder, Colorado. He is also the Chair of the Institute of Electrical and Electronics Engineers (IEEE) Microwave Theory and Techniques Society's Technical Committee on Radio Frequency Nanotechnology.

1. An introduction to radio frequency nanoelectronics; 2. Core concepts of microwave and RF measurements; 3. Extreme-impedance measurements; 4. On-wafer measurements of RF nanoelectronic devices; 5. Modeling and validation of RF nanoelectronic devices; 6. Characterization of nanofiber devices; 7. Instrumentation for near-field scanning microwave microscopy; 8. Probe-based measurement systems; 9. Radio frequency scanning probe measurements of materials; 10. Measurement of active nanoelectronic devices; 11. Dopant profiling in semiconductor nanoelectronics; 12. Depth profiling; 13. Dynamics of nanoscale magnetic systems; 14. Nanoscale electromagnetic measurements for life science applications.