Bültmann & Gerriets
Measurement Techniques for Radio Frequency Nanoelectronics
von T. Mitch Wallis
Verlag: Cambridge University Press
Reihe: The Cambridge RF and Microwave Engineering Series
E-Book / EPUB
Kopierschutz: Adobe DRM


Speicherplatz: 20 MB
Hinweis: Nach dem Checkout (Kasse) wird direkt ein Link zum Download bereitgestellt. Der Link kann dann auf PC, Smartphone oder E-Book-Reader ausgeführt werden.
E-Books können per PayPal bezahlt werden. Wenn Sie E-Books per Rechnung bezahlen möchten, kontaktieren Sie uns bitte.

ISBN: 978-1-108-32591-2
Erschienen am 14.09.2017
Sprache: Englisch

Preis: 103,99 €

Klappentext

Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials. * Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides * Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy * Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materials Featuring numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics.


andere Formate
weitere Titel der Reihe