Bültmann & Gerriets
^
Einband
Verfügbarkeit
Titel auch in diesen Sprachen:Englisch Französisch Spanisch Italienisch
Noch nicht das Passende gefunden?
Oscillation-Based Test in Mixed-Signal Circuits
160,49 €
in ca. 14 Tage
Buch
Autor
A Designer¿s Guide to Built-In Self-Test
213,99 €
in ca. 14 Tage
Buch
SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
106,99 €
in ca. 14 Tage
Buch
Power-Constrained Testing of VLSI Circuits
106,99 €
in ca. 14 Tage
Buch
High Performance Memory Testing
160,49 €
in ca. 14 Tage
Buch
Embedded Processor-Based Self-Test
160,49 €
in ca. 14 Tage
Buch
Introduction to Advanced System-on-Chip Test Design and Optimization
160,49 €
in ca. 14 Tage
Buch
Autor
Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation
160,49 €
in ca. 14 Tage
Buch
Elements of STIL
160,49 €
in ca. 14 Tage
Buch
Verification by Error Modeling
106,99 €
in ca. 14 Tage
Buch
Testing Static Random Access Memories
106,99 €
in ca. 14 Tage
Buch
Oscillation-Based Test in Mixed-Signal Circuits
149,79 €
Download PDF
Buch
Autor
New Methods of Concurrent Checking
96,29 €
Download PDF
Buch
Embedded Processor-Based Self-Test
149,79 €
Download PDF
Buch
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
160,49 €
Download PDF
Buch
Autor
New Methods of Concurrent Checking
112,50 €
zum 10. November
Buch
CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies
186,50 €
zum 10. November
Buch
Autor
Test Resource Partitioning for System-On-A-Chip
113,50 €
zum 10. November
Buch